{"product_id":"noise-analysis-and-measurement-for-active-pixel-sensor-readout-methods-paperback-2","title":"Noise Analysis and Measurement for Active Pixel Sensor Readout Methods - Paperback","description":"\u003cdiv\u003e\u003cp style=\"text-align: right;\"\u003e\u003ca href=\"https:\/\/reportcopyrightinfringement.com\/\" target=\"_blank\" rel=\"nofollow\"\u003e\u003cb\u003eReport copyright infringement\u003c\/b\u003e\u003c\/a\u003e\u003c\/p\u003e\u003c\/div\u003e\u003cp\u003eby \u003cb\u003eDali Wu\u003c\/b\u003e (Author)\u003c\/p\u003e\u003cp\u003eA detailed experimental and theoretical investigation of noise in both current mode and voltage mode amorphous silicon (a-Si) active pixel sensors (APS) has been performed. Both flicker (1\/f) and thermal are considered in this study. The experimental result in this paper emphasizes the computation of the output noise variance. The theoretical analysis shows that the voltage mode APS has an advantage over the current mode APS in terms of the flicker noise due to the operation of the readout process. The experimental data are compared to the theoretical analysis and are in good agreement.\u003c\/p\u003e\n            \u003cdiv\u003e\n\u003cstrong\u003eNumber of Pages:\u003c\/strong\u003e 92\u003c\/div\u003e\n            \u003cdiv\u003e\n\u003cstrong\u003eDimensions:\u003c\/strong\u003e 0.22 x 9 x 6 IN\u003c\/div\u003e\n            \u003cdiv\u003e\n\u003cstrong\u003ePublication Date:\u003c\/strong\u003e June 05, 2011\u003c\/div\u003e\n            ","brand":"BooksCloud","offers":[{"title":"Default Title","offer_id":47392110280953,"sku":"9783639361544","price":76.21,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0789\/2782\/3097\/files\/yndU70u7YQ9783639361544_f6ffea82-f288-4b60-a0c4-758e89a5941d.webp?v=1770236713","url":"https:\/\/bookscloud.io\/products\/noise-analysis-and-measurement-for-active-pixel-sensor-readout-methods-paperback-2","provider":"BooksCloud Book Dropshipping","version":"1.0","type":"link"}