Advanced Characterization Technologies for Secondary Batteries

Advanced Characterization Technologies for Secondary Batteries - Paperback

$90.45
Sale price  $90.45 Regular price 
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Advanced Characterization Technologies for Secondary Batteries

Advanced Characterization Technologies for Secondary Batteries - Paperback

$90.45
Sale price  $90.45 Regular price 

by Fan Xu (Editor), Chunli Li (Editor), Tinglu Song (Author)

This book focuses on crucial characterization methods adopted for materials, design, and performance of secondary batteries. The book is divided into eight chapters aiming to provide comprehensive and essential guidance on battery characterizations. Each chapter focuses on a specific technique: electron microscopy, focused ion beam methods, atomic force microscopy, X-ray photoelectron spectroscopy, time-of-flight secondary ion mass spectra, neutron diffraction, synchrotron-radiation X-ray tomography, and ultrasonic nondestructive testing.

Key Features

- Comprehensive coverage of characterization techniques for secondary battery technology

- Explains the working principle, essential functions and data analysis for each technique

- In-depth review of recent applications of secondary batteries from both material and device perspectives

- Detailed reference list for advanced readers

This monograph is intended as a resource for the broad research community involved in materials and device testing for batteries at academic and industrial levels. It also serves as a reference for engineering students required to learn advanced characterization techniques for developing rechargeable battery technology.
Number of Pages: 230
Dimensions: 0.6 x 10 x 7 IN
Publication Date: November 04, 2024

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